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Description

PELCO X-CHECKER™ BDESCRIPTION The addition of a boron nitride sample to the PELCO X Checker B, #602 02 provides a more sensitive monitor of low end performance on thin window and windowless detectors. Instruction booklet and storage case included. PELCO Technical Notes, PELCO X Checker (710KB PDF) See mount selections, types A R 602 02 PELCO X Checker B: Mn, Cu, Ni, C, and BN, 400 mesh Ni grid, Unmounted 602 02A PELCO X Checker B: Mn, Cu, Ni, C, and BN, 400 mesh Ni

Four reference specimens are now available that are suitable for testing the atomic number contrast performance of a backscattered electron detection system

70° pre-tilt EBSD holder has a removable pin to allow M4 mounting

5nm) on the sample surface demonstrating both chemical and mechanical stability

MRS-3 is more radiation resistant

5002-11 Aesculap® Dissection Forceps

6 ") Weight 11 kg (24 lbs

A pack of 10 High quality etched silicon probes for soft TappingMode™ and other non-contact modes

PELCO SEMClip™ on compact variable tilt mount 0-90°

Low profile pin with standard 1/8" (3

Sapphire can be wetted by glass

The range in force constants enables users to image extremely soft samples in contact mode as well as high load vs distance spectroscopy

Wafer is polished on one side

Exchange/Return Notes